BibTeX record conf/vlsi/SchvittzFRB19

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@inproceedings{DBLP:conf/vlsi/SchvittzFRB19,
  author       = {Rafael B. Schvittz and
                  Denis Teixeira Franco and
                  Leomar S. da Rosa and
                  Paulo F. Butzen},
  editor       = {Carolina Metzler and
                  Pierre{-}Emmanuel Gaillardon and
                  Giovanni De Micheli and
                  Carlos Silva C{\'{a}}rdenas and
                  Ricardo Reis},
  title        = {An Improved Technique for Logic Gate Susceptibility Evaluation of
                  Single Event Transient Faults},
  booktitle    = {VLSI-SoC: New Technology Enabler - 27th {IFIP} {WG} 10.5/IEEE International
                  Conference on Very Large Scale Integration, VLSI-SoC 2019, Cusco,
                  Peru, October 6-9, 2019, Revised and Extended Selected Papers},
  series       = {{IFIP} Advances in Information and Communication Technology},
  volume       = {586},
  pages        = {69--88},
  publisher    = {Springer},
  year         = {2019},
  url          = {https://doi.org/10.1007/978-3-030-53273-4\_4},
  doi          = {10.1007/978-3-030-53273-4\_4},
  timestamp    = {Thu, 14 Oct 2021 10:31:35 +0200},
  biburl       = {https://dblp.org/rec/conf/vlsi/SchvittzFRB19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}