BibTeX record conf/vlsi-dat/KakutaKKMT20

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@inproceedings{DBLP:conf/vlsi-dat/KakutaKKMT20,
  author       = {Yoshiki Kakuta and
                  Reika Kinoshita and
                  Hiroshi Kinoshita and
                  Chihiro Matsui and
                  Ken Takeuchi},
  title        = {Real-time Error Monitoring System Considering Endurance and Data-retention
                  Characteristics of TaOX-based ReRAM Storage with Workloads at Data
                  Centers},
  booktitle    = {2020 International Symposium on {VLSI} Design, Automation and Test,
                  {VLSI-DAT} 2020, Hsinchu, Taiwan, August 10-13, 2020},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/VLSI-DAT49148.2020.9196379},
  doi          = {10.1109/VLSI-DAT49148.2020.9196379},
  timestamp    = {Tue, 29 Sep 2020 11:41:13 +0200},
  biburl       = {https://dblp.org/rec/conf/vlsi-dat/KakutaKKMT20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}