Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Real-time Error Monitoring System Considering Endurance and Data-retention ..."

Yoshiki Kakuta et al. (2020)

> Home

Details and statistics

DOI: 10.1109/VLSI-DAT49148.2020.9196379

access: closed

type: Conference or Workshop Paper

metadata version: 2020-09-29

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/vlsi-dat/KakutaKKMT20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsi-dat/KakutaKKMT20
Yoshiki Kakuta, Reika Kinoshita, Hiroshi Kinoshita, Chihiro Matsui, Ken Takeuchi:
Real-time Error Monitoring System Considering Endurance and Data-retention Characteristics of TaOX-based ReRAM Storage with Workloads at Data Centers. VLSI-DAT 2020: 1-4

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.