BibTeX
@inproceedings{DBLP:conf/slip/Lienig05,
author = {Jens Lienig},
title = {Interconnect and current density stress: an introduction
to electromigration-aware design},
booktitle = {SLIP},
year = {2005},
pages = {81-88},
ee = {http://doi.acm.org/10.1145/1053355.1053374},
crossref = {DBLP:conf/slip/2005},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/slip/2005,
editor = {Igor L. Markov and
Mike Hutton},
title = {The Seventh International Workshop on System-Level Interconnect
Prediction (SLIP 2005), San Francisco, CA, USA, April 2-3,
2005, Proceedings},
booktitle = {SLIP},
publisher = {ACM},
year = {2005},
isbn = {1-59593-033-7},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2006-02-15 by Michael Ley (ley@uni-trier.de)