"Interconnect and current density stress: an introduction to ..."

Jens Lienig (2005)

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DOI: 10.1145/1053355.1053374

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Jens Lienig:
Interconnect and current density stress: an introduction to electromigration-aware design. SLIP 2005: 81-88

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