BibTeX record conf/sbcci/CorneliusSSSTS08

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@inproceedings{DBLP:conf/sbcci/CorneliusSSSTS08,
  author       = {Claas Cornelius and
                  Frank Sill and
                  Hagen S{\"{a}}mrow and
                  Jakob Salzmann and
                  Dirk Timmermann and
                  Di{\'{o}}genes Cecilio da Silva Jr.},
  editor       = {Marcelo Lubaszewski and
                  Michel Renovell and
                  Rajesh K. Gupta},
  title        = {Encountering gate oxide breakdown with shadow transistors to increase
                  reliability},
  booktitle    = {Proceedings of the 21st Annual Symposium on Integrated Circuits and
                  Systems Design, {SBCCI} 2008, Gramado, Brazil, September 1-4, 2008},
  pages        = {111--116},
  publisher    = {{ACM}},
  year         = {2008},
  url          = {https://doi.org/10.1145/1404371.1404407},
  doi          = {10.1145/1404371.1404407},
  timestamp    = {Fri, 27 Mar 2020 08:51:08 +0100},
  biburl       = {https://dblp.org/rec/conf/sbcci/CorneliusSSSTS08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}