BibTeX record conf/retis/RajithaTA15

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@inproceedings{DBLP:conf/retis/RajithaTA15,
  author       = {Rajitha Bakthula and
                  Anjana Tiwari and
                  Suneeta Agarwal},
  title        = {A new local homogeneity analysis method based on pixel intensities
                  for image defect detection},
  booktitle    = {2nd {IEEE} International Conference on Recent Trends in Information
                  Systems, ReTIS 2015, Kolkata, India, July 9-11, 2015},
  pages        = {200--206},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/ReTIS.2015.7232878},
  doi          = {10.1109/RETIS.2015.7232878},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/retis/RajithaTA15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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