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"A new local homogeneity analysis method based on pixel intensities for ..."

Rajitha Bakthula, Anjana Tiwari, Suneeta Agarwal (2015)

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DOI: 10.1109/RETIS.2015.7232878

access: closed

type: Conference or Workshop Paper

metadata version: 2018-05-03

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Rajitha Bakthula, Anjana Tiwari, Suneeta Agarwal:
A new local homogeneity analysis method based on pixel intensities for image defect detection. ReTIS 2015: 200-206

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