BibTeX record conf/nanoarch/0002CF11

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@inproceedings{DBLP:conf/nanoarch/0002CF11,
  author       = {Yao Wang and
                  Sorin Cotofana and
                  Liang Fang},
  title        = {A unified aging model of {NBTI} and {HCI} degradation towards lifetime
                  reliability management for nanoscale {MOSFET} circuits},
  booktitle    = {Proceedings of the 2011 {IEEE/ACM} International Symposium on Nanoscale
                  Architectures, {NANOARCH} 2011, San Diego, CA, USA, June 8-9, 2011},
  pages        = {175--180},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/NANOARCH.2011.5941501},
  doi          = {10.1109/NANOARCH.2011.5941501},
  timestamp    = {Thu, 23 Mar 2023 23:57:45 +0100},
  biburl       = {https://dblp.org/rec/conf/nanoarch/0002CF11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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