"A unified aging model of NBTI and HCI degradation towards lifetime ..."

Yao Wang, Sorin Cotofana, Liang Fang (2011)

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DOI: 10.1109/NANOARCH.2011.5941501

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Yao Wang, Sorin Cotofana, Liang Fang:
A unified aging model of NBTI and HCI degradation towards lifetime reliability management for nanoscale MOSFET circuits. NANOARCH 2011: 175-180

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