BibTeX record conf/mwscas/Zhuang0CC15

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@inproceedings{DBLP:conf/mwscas/Zhuang0CC15,
  author       = {Yuming Zhuang and
                  Tao Chen and
                  Shravan K. Chaganti and
                  Degang Chen},
  title        = {Effect of flicker noise on {SEIR} for accurate {ADC} linearity testing},
  booktitle    = {{IEEE} 58th International Midwest Symposium on Circuits and Systems,
                  {MWSCAS} 2015, Fort Collins, CO, USA, August 2-5, 2015},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/MWSCAS.2015.7282187},
  doi          = {10.1109/MWSCAS.2015.7282187},
  timestamp    = {Tue, 26 Jul 2022 14:45:21 +0200},
  biburl       = {https://dblp.org/rec/conf/mwscas/Zhuang0CC15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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