BibTeX record conf/mtdt/WangMCD06

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@inproceedings{DBLP:conf/mtdt/WangMCD06,
  author       = {Hua Wang and
                  Miguel Miranda and
                  Francky Catthoor and
                  Wim Dehaene},
  title        = {On the Combined Impact of Soft and Medium Gate Oxide Breakdown and
                  Process Variability on the Parametric Figures of {SRAM} components},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  pages        = {71--76},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.23},
  doi          = {10.1109/MTDT.2006.23},
  timestamp    = {Fri, 24 Mar 2023 00:03:36 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/WangMCD06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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