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"On the Combined Impact of Soft and Medium Gate Oxide Breakdown and Process ..."

Hua Wang et al. (2006)

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DOI: 10.1109/MTDT.2006.23

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/mtdt/WangMCD06
Hua Wang, Miguel Miranda, Francky Catthoor, Wim Dehaene:
On the Combined Impact of Soft and Medium Gate Oxide Breakdown and Process Variability on the Parametric Figures of SRAM components. MTDT 2006: 71-76

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