KarimiL02'

BibTeX

@inproceedings{DBLP:conf/mtdt/KarimiL02,
  author    = {Farzin Karimi and
               Fabrizio Lombardi},
  title     = {A Scan-Bist Environment for Testing Embedded Memories},
  booktitle = {MTDT},
  year      = {2002},
  pages     = {17-},
  ee        = {http://csdl.computer.org/comp/proceedings/mtdt/2002/1617/00/16170017abs.htm},
  crossref  = {DBLP:conf/mtdt/2002},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/mtdt/2002,
  title     = {10th IEEE International Workshop on Memory Technology, Design,
               and Testing (MTDT 2002), 10-12 July 2002, Isle of Bendor,
               France},
  booktitle = {MTDT},
  publisher = {IEEE Computer Society},
  year      = {2002},
  isbn      = {0-7695-1617-3},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}