


default search action
"A Scan-Bist Environment for Testing Embedded Memories."
Farzin Karimi, Fabrizio Lombardi (2002)
- Farzin Karimi, Fabrizio Lombardi:
A Scan-Bist Environment for Testing Embedded Memories. MTDT 2002: 17-

manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.