BibTeX record conf/latw/ChampacFRM23

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@inproceedings{DBLP:conf/latw/ChampacFRM23,
  author       = {V{\'{\i}}ctor H. Champac and
                  Freddy Forero and
                  Michel Renovell and
                  Leonardo Miceli},
  title        = {A New Defect Model due to a Dust Particle Affecting the Fingers of
                  FinFET Logic Gates},
  booktitle    = {24th {IEEE} Latin American Test Symposium, {LATS} 2023, Veracruz,
                  Mexico, March 21-24, 2023},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/LATS58125.2023.10154490},
  doi          = {10.1109/LATS58125.2023.10154490},
  timestamp    = {Wed, 28 Jun 2023 16:25:05 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/ChampacFRM23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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