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BibTeX record conf/kes/BishHH00
@inproceedings{DBLP:conf/kes/BishHH00, author = {N. B. Bish and Peter A. Howson and Robert J. Howlett}, editor = {Robert J. Howlett and Lakhmi C. Jain}, title = {Condition diagnostics of a physical breakdown mechanism in high voltage dielectrics utilising 'AI' evaluation techniques}, booktitle = {Fourth International Conference on Knowledge-Based Intelligent Information Engineering Systems {\&} Allied Technologies, {KES} 2000, Brighton, UK, 30 August - 1 September 2000, Proceedings, 2 Volumes}, pages = {644--650}, publisher = {{IEEE}}, year = {2000}, url = {https://doi.org/10.1109/KES.2000.884129}, doi = {10.1109/KES.2000.884129}, timestamp = {Sun, 21 May 2017 00:17:56 +0200}, biburl = {https://dblp.org/rec/conf/kes/BishHH00.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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