"Condition diagnostics of a physical breakdown mechanism in high voltage ..."

N. B. Bish, Peter A. Howson, Robert J. Howlett (2000)

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DOI: 10.1109/KES.2000.884129

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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N. B. Bish, Peter A. Howson, Robert J. Howlett:
Condition diagnostics of a physical breakdown mechanism in high voltage dielectrics utilising 'AI' evaluation techniques. KES 2000: 644-650

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