BibTeX record conf/itc/TraynorHYK21

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@inproceedings{DBLP:conf/itc/TraynorHYK21,
  author       = {Stephen Traynor and
                  Chen He and
                  Y. Y. Yu and
                  Ken Klein},
  title        = {Adaptive High Voltage Stress Methodology to Enable Automotive Quality
                  on FinFET Technologies},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
                  October 10-15, 2021},
  pages        = {289--293},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ITC50571.2021.00039},
  doi          = {10.1109/ITC50571.2021.00039},
  timestamp    = {Mon, 29 Nov 2021 13:31:58 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/TraynorHYK21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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