"Adaptive High Voltage Stress Methodology to Enable Automotive Quality on ..."

Stephen Traynor et al. (2021)

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DOI: 10.1109/ITC50571.2021.00039

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Stephen Traynor, Chen He, Y. Y. Yu, Ken Klein:
Adaptive High Voltage Stress Methodology to Enable Automotive Quality on FinFET Technologies. ITC 2021: 289-293

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