BibTeX record conf/itc/SinghK91

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@inproceedings{DBLP:conf/itc/SinghK91,
  author       = {Adit D. Singh and
                  C. Mani Krishna},
  title        = {On Optimizing Wafer-Probe Testing for Product Quality Using Die-Yield
                  Prediction},
  booktitle    = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
                  Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
  pages        = {228--237},
  publisher    = {{IEEE} Computer Society},
  year         = {1991},
  url          = {https://doi.org/10.1109/TEST.1991.519514},
  doi          = {10.1109/TEST.1991.519514},
  timestamp    = {Sat, 10 Sep 2022 20:48:50 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/SinghK91.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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