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BibTeX record conf/itc/QuachPFKO02
@inproceedings{DBLP:conf/itc/QuachPFKO02, author = {Minh Quach and Tuan Pham and Tim Figal and Bob Kopitzke and Pete O'Neill}, title = {Wafer-Level Defect-Based Testing Using Enhanced Voltage Stress and Statistical Test Data Evaluation}, booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002}, pages = {683--692}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/TEST.2002.1041820}, doi = {10.1109/TEST.2002.1041820}, timestamp = {Thu, 23 Mar 2023 23:58:42 +0100}, biburl = {https://dblp.org/rec/conf/itc/QuachPFKO02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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