QuachPFKO02'

@inproceedings{DBLP:conf/itc/QuachPFKO02,
  author    = {Minh Quach and
               Tuan Pham and
               Tim Figal and
               Bob Kopitzke and
               Pete O'Neill},
  title     = {Wafer-Level Defect-Based Testing Using Enhanced Voltage
               Stress and Statistical Test Data Evaluation},
  booktitle = {ITC},
  year      = {2002},
  pages     = {683-692},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041820},
  crossref  = {DBLP:conf/itc/2002},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/2002,
  title     = {Proceedings IEEE International Test Conference 2002, Baltimore,
               MD, USA, October 7-10, 2002},
  publisher = {IEEE Computer Society},
  year      = {2002},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}