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"Wafer-Level Defect-Based Testing Using Enhanced Voltage Stress and ..."
Minh Quach et al. (2002)
- Minh Quach, Tuan Pham, Tim Figal, Bob Kopitzke, Pete O'Neill:
Wafer-Level Defect-Based Testing Using Enhanced Voltage Stress and Statistical Test Data Evaluation. ITC 2002: 683-692
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