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BibTeX record conf/itc/OzakiSWGUM96
@inproceedings{DBLP:conf/itc/OzakiSWGUM96, author = {Kazuyuki Ozaki and Hidenori Sekiguchi and Shinichi Wakana and Yoshiro Goto and Yasutoshi Umehara and Jun Matsumoto}, title = {Novel Optical Probing System with Submicron Spatial Resolution for Internal Diagnosis of {VLSI} Circuits}, booktitle = {Proceedings {IEEE} International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996}, pages = {269--275}, publisher = {{IEEE} Computer Society}, year = {1996}, url = {https://doi.org/10.1109/TEST.1996.556971}, doi = {10.1109/TEST.1996.556971}, timestamp = {Thu, 23 Mar 2023 23:58:38 +0100}, biburl = {https://dblp.org/rec/conf/itc/OzakiSWGUM96.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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