BibTeX record conf/itc/MarinissenFPSJW18

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@inproceedings{DBLP:conf/itc/MarinissenFPSJW18,
  author       = {Erik Jan Marinissen and
                  Ferenc Fodor and
                  Arnita Podpod and
                  Michele Stucchi and
                  Yu{-}Rong Jian and
                  Cheng{-}Wen Wu},
  title        = {Solutions to Multiple Probing Challenges for Test Access to Multi-Die
                  Stacked Integrated Circuits},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
                  October 29 - Nov. 1, 2018},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/TEST.2018.8624731},
  doi          = {10.1109/TEST.2018.8624731},
  timestamp    = {Mon, 05 Feb 2024 20:31:29 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MarinissenFPSJW18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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