BibTeX record conf/itc/LefevreDGV21

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@inproceedings{DBLP:conf/itc/LefevreDGV21,
  author       = {J. Lefevre and
                  Philippe Debaud and
                  Patrick Girard and
                  Arnaud Virazel},
  title        = {A Fast and Low Cost Embedded Test Solution for {CMOS} Image Sensors},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
                  October 10-15, 2021},
  pages        = {1--9},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ITC50571.2021.00007},
  doi          = {10.1109/ITC50571.2021.00007},
  timestamp    = {Tue, 21 Mar 2023 21:02:05 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/LefevreDGV21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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