"A Fast and Low Cost Embedded Test Solution for CMOS Image Sensors."

Julia Lefevre et al. (2021)

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DOI: 10.1109/ITC50571.2021.00007

access: closed

type: Conference or Workshop Paper

metadata version: 2025-09-11

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Julia Lefevre, Philippe Debaud, Patrick Girard, Arnaud Virazel:
A Fast and Low Cost Embedded Test Solution for CMOS Image Sensors. ITC 2021: 1-9

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