BibTeX record conf/itc/KikuchiHMYT89

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@inproceedings{DBLP:conf/itc/KikuchiHMYT89,
  author       = {Shuji Kikuchi and
                  Yoshihiko Hayashi and
                  Takashi Matsumoto and
                  Ryozou Yoshino and
                  Ryuichi Takagi},
  title        = {A 250 MHz Shared-Resource {VLSI} Test System with High Pin Count and
                  Memory Test Capability},
  booktitle    = {Proceedings International Test Conference 1989, Washington, D.C.,
                  USA, August 1989},
  pages        = {558--566},
  publisher    = {{IEEE} Computer Society},
  year         = {1989},
  url          = {https://doi.org/10.1109/TEST.1989.82340},
  doi          = {10.1109/TEST.1989.82340},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/KikuchiHMYT89.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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