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"A 250 MHz Shared-Resource VLSI Test System with High Pin Count and Memory ..."
Shuji Kikuchi et al. (1989)
- Shuji Kikuchi, Yoshihiko Hayashi, Takashi Matsumoto, Ryozou Yoshino, Ryuichi Takagi:
A 250 MHz Shared-Resource VLSI Test System with High Pin Count and Memory Test Capability. ITC 1989: 558-566
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