BibTeX record conf/itc/KawaiSFKKOS83

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@inproceedings{DBLP:conf/itc/KawaiSFKKOS83,
  author       = {Masato Kawai and
                  Hideo Shibano and
                  Shigehiro Funatsu and
                  Shunichi Kato and
                  T. Kurobe and
                  K. Ookawa and
                  Tohru Sasaki},
  title        = {A High Level Test Pattern Generation Algorithm},
  booktitle    = {Proceedings International Test Conference 1983, Philadelphia, PA,
                  USA, October 1983},
  pages        = {346--353},
  publisher    = {{IEEE} Computer Society},
  year         = {1983},
  timestamp    = {Tue, 28 Feb 2012 16:43:10 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/KawaiSFKKOS83.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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