@inproceedings{DBLP:conf/itc/KawaiSFKKOS83,
author = {Masato Kawai and
H. Shibano and
S. Funatsu and
S. Kato and
T. Kurobe and
K. Ookawa and
T. Sasaki},
title = {A High Level Test Pattern Generation Algorithm},
booktitle = {ITC},
year = {1983},
pages = {346-353},
crossref = {DBLP:conf/itc/1983},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/1983,
title = {Proceedings International Test Conference 1983, Philadelphia,
PA, USA, October 1983},
booktitle = {ITC},
publisher = {IEEE Computer Society},
year = {1983},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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