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"A High Level Test Pattern Generation Algorithm."
Masato Kawai et al. (1983)
- Masato Kawai, Hideo Shibano, Shigehiro Funatsu, Shunichi Kato, T. Kurobe, K. Ookawa, Tohru Sasaki:
A High Level Test Pattern Generation Algorithm. ITC 1983: 346-353
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