BibTeX record conf/itc/HsiaoTWLWC23

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@inproceedings{DBLP:conf/itc/HsiaoTWLWC23,
  author       = {Sam M.{-}H. Hsiao and
                  Amy H.{-}Y. Tsai and
                  Lowry P.{-}T. Wang and
                  Aaron C.{-}W. Liang and
                  Charles H.{-}P. Wen and
                  Herming Chiueh},
  title        = {Preventing Single-Event Double-Node Upsets by Engineering Change Order
                  in Latch Designs},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
                  October 7-15, 2023},
  pages        = {276--285},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ITC51656.2023.00044},
  doi          = {10.1109/ITC51656.2023.00044},
  timestamp    = {Tue, 07 May 2024 20:06:46 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/HsiaoTWLWC23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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