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"Preventing Single-Event Double-Node Upsets by Engineering Change Order in ..."

Sam M.-H. Hsiao et al. (2023)

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DOI: 10.1109/ITC51656.2023.00044

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Sam M.-H. Hsiao, Amy H.-Y. Tsai, Lowry P.-T. Wang, Aaron C.-W. Liang, Charles H.-P. Wen, Herming Chiueh:
Preventing Single-Event Double-Node Upsets by Engineering Change Order in Latch Designs. ITC 2023: 276-285

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