BibTeX record conf/itc/FrischAAGHMNRS95

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@inproceedings{DBLP:conf/itc/FrischAAGHMNRS95,
  author       = {A. Frisch and
                  Mitch Aigner and
                  T. Almy and
                  Hans J. Greub and
                  M. Hazra and
                  S. Mohr and
                  Nicholas J. Naclerio and
                  W. Russell and
                  M. Stebniskey},
  title        = {Supplying Known-Good Die for {MCM} Applications Using Low-Cost Embedded
                  Testing},
  booktitle    = {Proceedings {IEEE} International Test Conference 1995, Driving Down
                  the Cost of Test, Washington, DC, USA, October 21-25, 1995},
  pages        = {328--335},
  publisher    = {{IEEE} Computer Society},
  year         = {1995},
  url          = {https://doi.org/10.1109/TEST.1995.529857},
  doi          = {10.1109/TEST.1995.529857},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/FrischAAGHMNRS95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}