BibTeX record: conf/itc/FrischAAGHMNRS95

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@inproceedings{DBLP:conf/itc/FrischAAGHMNRS95,
  author    = {A. Frisch and
               Mitch Aigner and
               T. Almy and
               Hans J. Greub and
               M. Hazra and
               S. Mohr and
               Nicholas J. Naclerio and
               W. Russell and
               M. Stebniskey},
  title     = {Supplying Known-Good Die for {MCM} Applications Using Low-Cost Embedded
               Testing},
  booktitle = {Proceedings {IEEE} International Test Conference 1995, Driving Down
               the Cost of Test, Washington, DC, USA, October 21-25, 1995},
  year      = {1995},
  pages     = {328--335},
  crossref  = {DBLP:conf/itc/1995},
  url       = {http://dx.doi.org/10.1109/TEST.1995.529857},
  doi       = {10.1109/TEST.1995.529857},
  timestamp = {Tue, 21 Oct 2014 21:19:33 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/FrischAAGHMNRS95},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/itc/1995,
  title     = {Proceedings {IEEE} International Test Conference 1995, Driving Down
               the Cost of Test, Washington, DC, USA, October 21-25, 1995},
  year      = {1995},
  publisher = {{IEEE} Computer Society},
  isbn      = {0-7803-2992-9},
  timestamp = {Tue, 21 Oct 2014 21:19:33 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/1995},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}