FrischAAGHMNRS95'

@inproceedings{DBLP:conf/itc/FrischAAGHMNRS95,
  author    = {A. Frisch and
               Mitch Aigner and
               T. Almy and
               Hans J. Greub and
               M. Hazra and
               S. Mohr and
               Nicholas J. Naclerio and
               W. Russell and
               M. Stebniskey},
  title     = {Supplying Known-Good Die for MCM Applications Using Low-Cost
               Embedded Testing},
  booktitle = {ITC},
  year      = {1995},
  pages     = {328-335},
  ee        = {http://dx.doi.org/10.1109/TEST.1995.529857},
  crossref  = {DBLP:conf/itc/1995},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/1995,
  title     = {Proceedings IEEE International Test Conference 1995, Driving
               Down the Cost of Test, Washington, DC, USA, October 21-25,
               1995},
  publisher = {IEEE Computer Society},
  year      = {1995},
  isbn      = {0-7803-2992-9},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}