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"Supplying Known-Good Die for MCM Applications Using Low-Cost Embedded Testing."
A. Frisch et al. (1995)
- A. Frisch, Mitch Aigner, T. Almy, Hans J. Greub, M. Hazra, S. Mohr, Nicholas J. Naclerio, W. Russell, M. Stebniskey:
Supplying Known-Good Die for MCM Applications Using Low-Cost Embedded Testing. ITC 1995: 328-335
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