BibTeX record conf/itc/DobbelaereCCVXG19

download as .bib file

@inproceedings{DBLP:conf/itc/DobbelaereCCVXG19,
  author       = {Wim Dobbelaere and
                  Frederik Colle and
                  Anthony Coyette and
                  Ronny Vanhooren and
                  Nektar Xama and
                  Jhon Gomez and
                  Georges G. E. Gielen},
  title        = {Applying Vstress and defect activation coverage to produce zero-defect
                  mixed-signal automotive ICs},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
                  USA, November 9-15, 2019},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ITC44170.2019.9000123},
  doi          = {10.1109/ITC44170.2019.9000123},
  timestamp    = {Thu, 14 Oct 2021 09:45:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/DobbelaereCCVXG19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.