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BibTeX record conf/itc/BlantonNL15
@inproceedings{DBLP:conf/itc/BlantonNL15, author = {R. D. (Shawn) Blanton and Benjamin Niewenhuis and Zeye (Dexter) Liu}, title = {Design reflection for optimal test-chip implementation}, booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA, USA, October 6-8, 2015}, pages = {1--10}, publisher = {{IEEE}}, year = {2015}, url = {https://doi.org/10.1109/TEST.2015.7342379}, doi = {10.1109/TEST.2015.7342379}, timestamp = {Mon, 24 Feb 2020 17:28:37 +0100}, biburl = {https://dblp.org/rec/conf/itc/BlantonNL15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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