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"Design reflection for optimal test-chip implementation."

R. D. (Shawn) Blanton, Benjamin Niewenhuis, Zeye (Dexter) Liu (2015)

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DOI: 10.1109/TEST.2015.7342379

access: closed

type: Conference or Workshop Paper

metadata version: 2020-02-24

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R. D. (Shawn) Blanton, Benjamin Niewenhuis, Zeye (Dexter) Liu:
Design reflection for optimal test-chip implementation. ITC 2015: 1-10

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