BibTeX record conf/itc-asia/MarinissenFWKHS17

download as .bib file

@inproceedings{DBLP:conf/itc-asia/MarinissenFWKHS17,
  author       = {Erik Jan Marinissen and
                  Ferenc Fodor and
                  Bart De Wachter and
                  Jorg Kiesewetter and
                  Eric Hill and
                  Ken Smith},
  title        = {A fully automatic test system for characterizing large-array fine-pitch
                  micro-bump probe cards},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {144--149},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097130},
  doi          = {10.1109/ITC-ASIA.2017.8097130},
  timestamp    = {Mon, 05 Feb 2024 20:35:21 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/MarinissenFWKHS17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.