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"A fully automatic test system for characterizing large-array fine-pitch ..."
Erik Jan Marinissen et al. (2017)
- Erik Jan Marinissen
, Ferenc Fodor, Bart De Wachter, Jorg Kiesewetter, Eric Hill, Ken Smith:
A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards. ITC-Asia 2017: 144-149
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