BibTeX record conf/itc-asia/LeeHKK20

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@inproceedings{DBLP:conf/itc-asia/LeeHKK20,
  author       = {Hayoung Lee and
                  Donghyun Han and
                  Hogyeong Kim and
                  Sungho Kang},
  title        = {{W-ERA:} One-Time Memory Repair with Wafer-Level Early Repair Analysis
                  for Cost Reduction},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2020, Taipei,
                  Taiwan, September 23-25, 2020},
  pages        = {94--99},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ITC-Asia51099.2020.00028},
  doi          = {10.1109/ITC-ASIA51099.2020.00028},
  timestamp    = {Tue, 27 Feb 2024 16:41:39 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/LeeHKK20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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