BibTeX record conf/itc-asia/LeeH21

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@inproceedings{DBLP:conf/itc-asia/LeeH21,
  author       = {Yi{-}Hsuan Lee and
                  Shi{-}Yu Huang},
  title        = {Rigorous Test Flow for {PLL} to Identify Weak Devices},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2021, Shanghai,
                  China, August 18-20, 2021},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ITC-Asia53059.2021.9808590},
  doi          = {10.1109/ITC-ASIA53059.2021.9808590},
  timestamp    = {Fri, 15 Jul 2022 10:59:39 +0200},
  biburl       = {https://dblp.org/rec/conf/itc-asia/LeeH21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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