BibTeX record conf/itc-asia/KawabataASYK17

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@inproceedings{DBLP:conf/itc-asia/KawabataASYK17,
  author       = {Masayuki Kawabata and
                  Koji Asami and
                  Shohei Shibuya and
                  Tomonori Yanagida and
                  Haruo Kobayashi},
  title        = {Low-distortion signal generation for analog/mixed-signal circuit testing
                  with digital {ATE}},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {2--7},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097100},
  doi          = {10.1109/ITC-ASIA.2017.8097100},
  timestamp    = {Mon, 09 Aug 2021 14:54:04 +0200},
  biburl       = {https://dblp.org/rec/conf/itc-asia/KawabataASYK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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