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"Low-distortion signal generation for analog/mixed-signal circuit testing ..."

Masayuki Kawabata et al. (2017)

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DOI: 10.1109/ITC-ASIA.2017.8097100

access: closed

type: Conference or Workshop Paper

metadata version: 2020-02-06

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  dblp key:
  - conf/itc-asia/KawabataASYK17
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  - https://dblp.org/rec/conf/itc-asia/KawabataASYK17
Masayuki Kawabata, Koji Asami, Shohei Shibuya, Tomonori Yanagida, Haruo Kobayashi:
Low-distortion signal generation for analog/mixed-signal circuit testing with digital ATE. ITC-Asia 2017: 2-7

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