BibTeX record conf/itc-asia/0001TD19

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@inproceedings{DBLP:conf/itc-asia/0001TD19,
  author       = {Sebastian Huhn and
                  Daniel Tille and
                  Rolf Drechsler},
  title        = {A Hybrid Embedded Multichannel Test Compression Architecture for Low-Pin
                  Count Test Environments in Safety-Critical Systems},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2019, Tokyo,
                  Japan, September 3-5, 2019},
  pages        = {115--120},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ITC-Asia.2019.00033},
  doi          = {10.1109/ITC-ASIA.2019.00033},
  timestamp    = {Fri, 27 Mar 2020 08:58:36 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/0001TD19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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