"A Hybrid Embedded Multichannel Test Compression Architecture for Low-Pin ..."

Sebastian Huhn, Daniel Tille, Rolf Drechsler (2019)

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DOI: 10.1109/ITC-ASIA.2019.00033

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-27

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Sebastian Huhn, Daniel Tille, Rolf Drechsler:
A Hybrid Embedded Multichannel Test Compression Architecture for Low-Pin Count Test Environments in Safety-Critical Systems. ITC-Asia 2019: 115-120

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