BibTeX record conf/isqed/ShimH11

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@inproceedings{DBLP:conf/isqed/ShimH11,
  author       = {Kyu{-}Nam Shim and
                  Jiang Hu},
  title        = {Transient and fine-grained voltage adaptation for variation resilience
                  in {VLSI} interconnects},
  booktitle    = {Proceedings of the 12th International Symposium on Quality Electronic
                  Design, {ISQED} 2011, Santa Clara, California, USA, 14-16 March 2011},
  pages        = {80--86},
  publisher    = {{IEEE}},
  year         = {2011},
  url          = {https://doi.org/10.1109/ISQED.2011.5770707},
  doi          = {10.1109/ISQED.2011.5770707},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/isqed/ShimH11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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