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"Transient and fine-grained voltage adaptation for variation resilience in ..."

Kyu-Nam Shim, Jiang Hu (2011)

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DOI: 10.1109/ISQED.2011.5770707

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Kyu-Nam Shim, Jiang Hu:
Transient and fine-grained voltage adaptation for variation resilience in VLSI interconnects. ISQED 2011: 80-86

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