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BibTeX record conf/isqed/HanJQX013
@inproceedings{DBLP:conf/isqed/HanJQX013, author = {Yinhe Han and Song Jin and Jibing Qiu and Qiang Xu and Xiaowei Li}, title = {On predicting NBTI-induced circuit aging by isolating leakage change}, booktitle = {International Symposium on Quality Electronic Design, {ISQED} 2013, Santa Clara, CA, USA, March 4-6, 2013}, pages = {46--52}, publisher = {{IEEE}}, year = {2013}, url = {https://doi.org/10.1109/ISQED.2013.6523589}, doi = {10.1109/ISQED.2013.6523589}, timestamp = {Tue, 23 May 2023 16:44:01 +0200}, biburl = {https://dblp.org/rec/conf/isqed/HanJQX013.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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