BibTeX record conf/isqed/HanJQX013

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@inproceedings{DBLP:conf/isqed/HanJQX013,
  author       = {Yinhe Han and
                  Song Jin and
                  Jibing Qiu and
                  Qiang Xu and
                  Xiaowei Li},
  title        = {On predicting NBTI-induced circuit aging by isolating leakage change},
  booktitle    = {International Symposium on Quality Electronic Design, {ISQED} 2013,
                  Santa Clara, CA, USA, March 4-6, 2013},
  pages        = {46--52},
  publisher    = {{IEEE}},
  year         = {2013},
  url          = {https://doi.org/10.1109/ISQED.2013.6523589},
  doi          = {10.1109/ISQED.2013.6523589},
  timestamp    = {Tue, 23 May 2023 16:44:01 +0200},
  biburl       = {https://dblp.org/rec/conf/isqed/HanJQX013.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}