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"On predicting NBTI-induced circuit aging by isolating leakage change."

Yinhe Han et al. (2013)

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DOI: 10.1109/ISQED.2013.6523589

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-23

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  dblp key:
  - conf/isqed/HanJQX013
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  - https://dblp.org/rec/conf/isqed/HanJQX013
Yinhe Han, Song Jin, Jibing Qiu, Qiang Xu, Xiaowei Li:
On predicting NBTI-induced circuit aging by isolating leakage change. ISQED 2013: 46-52

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